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Day: May 23, 2026

Imaging ellipsometry for process control of MXene-based capacitive devices

By ultraglasscoatings.co.ukIn BlogPosted

May 23, 2026 Imaging ellipsometry enables non-destructive, multi-scale quality control of microstructured MXene thin films during device fabrication. (Nanowerk News) A German–Israeli research team led by Dr. Andreas Furchner has demonstrated how imaging ellipsometry enables non-destructive characterisation and quality control of microstructured MXene thin films during device fabrication. The authors...